VIS-SWIR imaging sensors

Imaging electronic sensors sensitive in visible, near infrared, short wavelength infrared spectral bands have found mass applications in industry, defense, security, science, environmental protection, medicine etc. Imaging sensors sensitive only in VIS-NIR range are almost exclusively silicon chips manufactured using a series of technologies: CCD, CMOS, ICCD, EMCCD, EBAPS, sCMOS in color or monochromatic versions. Color VIS/NIR sensors are sensitive to light only in visible range when monochromatic VIS/NIR sensors are sensitive up to about 1000nm. SWIR sensors are mostly InGaAs imaging sensors offered in several versions: standard non cooled sensitive in range from about 900nm to 1700nm; standard cooled sensors - about 1000nm to 2200nm; and expanded non cooled - about 600nm to 1700nm.

Inframet offers a set of three stations for testing VIS-SWIR imaging sensors: VIT, SIT and SOL. The stations differ in design and test capabilities. In simplification it can be said that VIT is an image projector that projects images of continuously regulated light intensity at a dozen of narrow spectral bands distributed in VIS-SWIR range; SIT is a calibrated light source of continuously regulated light intensity and continously regulated wavelength; SOL is calibrated light source of continuously regulated light intensity and step regulated spectral band.

SIT test station

VIT test station

SOL test station

VIT test station enables measurement of imaging, radiometric and photometric parameters at a dozen spectral bands of VIS-NIR range; SIT- radiometric parameters at continuously regulated wavelength in VIS-SWIR range; SOL - radiometric parameters at step regulated wavelength and photometric parameters in VIS-SWIR range.

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